Publication:

Impact of dimensions of memory periphery FinFETs on bias temperature instability

Date

2020
Journal article
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dc.contributor.authorBoubaaya, M
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorDjezzar, B
dc.contributor.authorFranco, Jacopo
dc.contributor.authorDentoni Litta, Eugenio
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorDupuy, Emmanuel
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorFazan, Pierre
dc.contributor.authorKim, C.
dc.contributor.authorBenaceur-Doumaz, D.
dc.contributor.authorFerhat Hamida, A.
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorDentoni Litta, Eugenio
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorDupuy, Emmanuel
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorFazan, Pierre
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecDupuy, Emmanuel::0000-0003-3341-1618
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-28T20:28:15Z
dc.date.available2021-10-28T20:28:15Z
dc.date.issued2020
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34814
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9052659
dc.source.beginpage269
dc.source.endpage277
dc.source.issue2
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.volume20
dc.title

Impact of dimensions of memory periphery FinFETs on bias temperature instability

dc.typeJournal article
dspace.entity.typePublication
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