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Growth and reliability of 3nm N2O gate oxide
Publication:
Growth and reliability of 3nm N2O gate oxide
Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nigam, Tanya
;
Depas, Michel
;
Heyns, Marc
Journal
Abstract
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1951
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1951
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations