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Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Publication:
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Date
2022
Journal article
https://doi.org/10.1002/admi.202102488
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lee, Kookjin
;
Ji, Hyunjin
;
Kim, Yanghee
;
Kaczer, Ben
;
Lee, Hyebin
;
Ahn, Jae-Pyoung
;
Choi, Junhee
;
Grill, Alexander
;
Panarella, Luca
;
Smets, Quentin
;
Verreck, Devin
;
Van Beek, Simon
;
Vaisman Chasin, Adrian
;
Linten, Dimitri
;
Na, Junhong
;
Lee, Jae Woo
;
De Wolf, Ingrid
;
Kim, Gyu-Tae
Journal
ADVANCED MATERIALS INTERFACES
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1170
since deposited on 2023-06-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1170
since deposited on 2023-06-20
Acq. date: 2025-10-23
Citations