Publication:

Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

Date

2022

Journal article

https://doi.org/10.1002/admi.202102488

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Author(s)

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Ahn, Jae-Pyoung

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Grill, Alexander

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Panarella, Luca

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Van Beek, Simon

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Vaisman Chasin, Adrian

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Linten, Dimitri

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De Wolf, Ingrid

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Journal

ADVANCED MATERIALS INTERFACES

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1173 since deposited on 2023-06-20

Acq. date: 2026-03-16