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Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
Publication:
Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
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Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tsiara, Artemisia
;
Srinivasan, Ashwyn
;
Balakrishnan, Sadhishkumar
;
Pantouvaki, Marianna
;
Absil, Philippe
;
Van Campenhout, Joris
;
Croes, Kristof
Journal
na
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Downloads
982
since deposited on 2021-11-02
69
last month
17
last week
Acq. date: 2026-03-17
Views
1871
since deposited on 2021-11-02
1
last month
Acq. date: 2026-03-17
Citations