Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
Publication:
Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators
Copy permalink
Date
2020
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Accepted version
388.64 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tsiara, Artemisia
;
Srinivasan, Ashwyn
;
Balakrishnan, Sadhishkumar
;
Pantouvaki, Marianna
;
Absil, Philippe
;
Van Campenhout, Joris
;
Croes, Kristof
Journal
na
Abstract
Description
Metrics
Downloads
740
since deposited on 2021-11-02
142
last month
28
last week
Acq. date: 2025-12-15
Views
1870
since deposited on 2021-11-02
Acq. date: 2025-12-15
Citations
Metrics
Downloads
740
since deposited on 2021-11-02
142
last month
28
last week
Acq. date: 2025-12-15
Views
1870
since deposited on 2021-11-02
Acq. date: 2025-12-15
Citations