Publication:

Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators

Date

2020
Proceedings Paper
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dc.contributor.authorTsiara, Artemisia
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorBalakrishnan, Sadhishkumar
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorAbsil, Philippe
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2021-12-08T10:23:49Z
dc.date.available2021-11-02T15:57:54Z
dc.date.available2021-12-08T10:23:49Z
dc.date.embargo2020-03-11
dc.date.issued2020
dc.identifier.eisbn978-1-9435-8071-2
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37646
dc.publisherIEEE
dc.source.conferenceOptical Fiber Communications Conference and Exposition (OFC)
dc.source.conferencedateMAR 08-12, 2020
dc.source.conferencelocationSan Diego
dc.source.journalna
dc.source.numberofpages3
dc.subject.keywordsSILICON PHOTONICS
dc.title

Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators

dc.typeProceedings paper
dspace.entity.typePublication
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