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Damage free integration of ultralow-k dielectrics by template replacement approach
Publication:
Damage free integration of ultralow-k dielectrics by template replacement approach
Date
2015
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Liping
;
de Marneffe, Jean-Francois
;
Heylen, Nancy
;
Murdoch, Gayle
;
Tokei, Zsolt
;
Boemmels, Juergen
;
De Gendt, Stefan
;
Baklanov, Mikhaïl
Journal
Applied Physics Letters
Abstract
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2030
since deposited on 2021-10-23
415
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Acq. date: 2025-10-24
Citations
Metrics
Views
2030
since deposited on 2021-10-23
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations