Publication:
RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1901 since deposited on 2021-10-22
3last month
1last week
Acq. date: 2026-08-08
Citations
Statistics
Views
1901 since deposited on 2021-10-22
3last month
1last week
Acq. date: 2026-08-08
Citations