Publication:
RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs
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1898 since deposited on 2021-10-22
Acq. date: 2026-04-07
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Statistics
Views
1898 since deposited on 2021-10-22
Acq. date: 2026-04-07
Citations