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Two-pulse C-V: a new method for characterization electron traps in the bulk of SiO2/high-k dielectric stacks
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1979 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08
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1979 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-08
Citations