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Depth profiling intrinsically hybrid layers and organic/inorganic stacks by variable-size argon clusters: a ToF-SIMS and XPS study
Publication:
Depth profiling intrinsically hybrid layers and organic/inorganic stacks by variable-size argon clusters: a ToF-SIMS and XPS study
Date
2018
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Busby, Yan
;
Noel, Celine
;
Franquet, Alexis
;
Spampinato, Valentina
;
Felten, Alexandre
;
Houssiau, Laurent
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Abstract
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1852
since deposited on 2021-10-25
Acq. date: 2025-10-25
Citations
Metrics
Views
1852
since deposited on 2021-10-25
Acq. date: 2025-10-25
Citations