Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Book chapters
SIMS analysis on the transistor scale: probing composition and dopants in non-planar, confined 3D-volumes
Publication:
SIMS analysis on the transistor scale: probing composition and dopants in non-planar, confined 3D-volumes
Copy permalink
Date
2017
Book Chapter
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Budrevich, Andre A.
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1883
since deposited on 2021-10-24
7
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1883
since deposited on 2021-10-24
7
last month
Acq. date: 2025-12-16
Citations