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Process sensitivity analysis for EPE optimization of MP18 SALELE BEOL patterning
Publication:
Process sensitivity analysis for EPE optimization of MP18 SALELE BEOL patterning
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3051089
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Soussou, Assawer
;
Kljucar, Luka
;
Dusa, Mircea
;
Mountsier, Tom
;
Jurczak, Gosia
;
Lowe, Brett
Journal
Proceedings of SPIE
Abstract
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Acq. date: 2026-02-24
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Views
58
since deposited on 2025-07-28
12
last month
9
last week
Acq. date: 2026-02-24
Citations