Publication:

Investigation of the electrical properties of Ge/high-k gate stack: GeO2 VS Si-cap

Date

2011
Meeting abstract
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Mitard, Jerome  
;
Bellenger, Florence
;
Witters, Liesbeth  
;
De Jaeger, Brice  
;
Vincent, Benjamin  
;
Nyns, Laura  
;
Martens, Koen  
;
Vrancken, Evi  
;
Wang, Gang
;
Lin, Dennis  
;
Loo, Roger  
;
Caymax, Matty  
;
De Meyer, Kristin  
;
Heyns, Marc  
;
Horiguchi, Naoto  

Journal

Abstract

Description

Metrics

Views

1903 since deposited on 2021-10-19
Acq. date: 2025-12-16

Citations

Metrics

Views

1903 since deposited on 2021-10-19
Acq. date: 2025-12-16

Citations