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Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors
Publication:
Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors
Date
2023
Journal article
https://doi.org/10.1109/TED.2023.3254509
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1.45 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lee, Sumi
;
Ronchi, Nicolo
;
Bizindavyi, Jasper
;
Popovici, Mihaela Ioana
;
Banerjee, Kaustuv
;
Walke, Amey
;
Delhougne, Romain
;
Van Houdt, Jan
;
Shin, Changhwan
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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1210
since deposited on 2023-04-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1210
since deposited on 2023-04-15
Acq. date: 2025-10-23
Citations