Publication:

Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors

Date

2023
Journal article
https://doi.org/10.1109/TED.2023.3254509
Simple item page Full metadata Statistics
 
dc.contributor.authorLee, Sumi
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorBizindavyi, Jasper
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorWalke, Amey
dc.contributor.authorDelhougne, Romain
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorShin, Changhwan
dc.contributor.imecauthorLee, Sumi
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorBizindavyi, Jasper
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecBizindavyi, Jasper::0000-0002-2213-9017
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecPopovici, Mihaela Ioana::0000-0002-9838-1088
dc.date.accessioned2023-07-25T13:14:43Z
dc.date.available2023-04-15T03:56:18Z
dc.date.available2023-07-25T13:14:43Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.description.wosFundingTextThis work was supported by the Ministry of Trade, Industry, and Energy (MOTIE) in South Korea through the Fostering Global Talents for Innovative Growth Program supervised by the Korea Institute for Advancement of Technology (KIAT) underGrant P0017312.
dc.identifier.doi10.1109/TED.2023.3254509
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41455
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage2568
dc.source.endpage2574
dc.source.issue5
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume70
dc.subject.keywordsFIELD-CYCLING BEHAVIOR
dc.title

Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
Analysis_of_Wake-Up_Reversal_Behavior_Induced_by_Imprint_in_LaHZO_MFM_Capacitors.pdf
Size:
1.45 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download
Publication available in collections:
Articles