Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Flare in extreme ultraviolet lithography: metrology, out-of-band radiation, fractal point spread function, and flare map calibration
Publication:
Flare in extreme ultraviolet lithography: metrology, out-of-band radiation, fractal point spread function, and flare map calibration
Date
2009
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lorusso, Gian
;
Van Roey, Frieda
;
Hendrickx, Eric
;
Fenger, Germain
;
Lam, Michael
;
Christian, Zuniga
;
Habib, Mohamed
;
Diab, Hesham
;
Word, James
Journal
Journal of Micro/Nanolithography, MEMS, and MOEMS
Abstract
Description
Metrics
Views
1947
since deposited on 2021-10-18
Acq. date: 2025-10-25
Citations
Metrics
Views
1947
since deposited on 2021-10-18
Acq. date: 2025-10-25
Citations