Publication:
μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
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1 since deposited on 2021-10-27
Acq. date: 2026-05-19
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1951 since deposited on 2021-10-27
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Acq. date: 2026-05-20
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1 since deposited on 2021-10-27
Acq. date: 2026-05-19
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1951 since deposited on 2021-10-27
2last month
Acq. date: 2026-05-20
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