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μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
Publication:
μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Canato, E.
;
Masin, F.
;
Borga, M.
;
Zanoni, E.
;
Meneghini, M.
;
Meneghesso, G.
;
Stockman, Arno
;
Banerjee, A.
;
Moens, P.
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since deposited on 2021-10-27
Acq. date: 2025-10-24
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1939
since deposited on 2021-10-27
Acq. date: 2025-10-24
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Downloads
1
since deposited on 2021-10-27
Acq. date: 2025-10-24
Views
1939
since deposited on 2021-10-27
Acq. date: 2025-10-24
Citations