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Analysis of plasma induced gate oxide damage in multi-level metal processing
Publication:
Analysis of plasma induced gate oxide damage in multi-level metal processing
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Date
1998
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yuan, Xiao Jie
;
Van den Bosch, Geert
;
Lietaer, Nicolas
;
Zagrebnov, Maxim
;
Debusschere, Ingrid
;
Deferm, Ludo
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1969
since deposited on 2021-10-01
Acq. date: 2025-12-10
Citations
Metrics
Views
1969
since deposited on 2021-10-01
Acq. date: 2025-12-10
Citations