Publication:
Superior electrostatic control in uniform monolayer MoS2 scaled transistors via in-situ surface smoothening
| dc.contributor.author | Shi, Yuanyuan | |
| dc.contributor.author | Groven, Benjamin | |
| dc.contributor.author | Smets, Quentin | |
| dc.contributor.author | Sutar, Surajit | |
| dc.contributor.author | Banerjee, Sreetama | |
| dc.contributor.author | Medina, Henry | |
| dc.contributor.author | Wu, Xiangyu | |
| dc.contributor.author | Huyghebaert, Cedric | |
| dc.contributor.author | Brems, Steven | |
| dc.contributor.author | Lin, Dennis | |
| dc.contributor.author | Morin, Pierre | |
| dc.contributor.author | Caymax, Matty | |
| dc.contributor.author | Asselberghs, Inge | |
| dc.contributor.author | Radu, Iuliana | |
| dc.contributor.imecauthor | Shi, Yuanyuan | |
| dc.contributor.imecauthor | Groven, Benjamin | |
| dc.contributor.imecauthor | Smets, Quentin | |
| dc.contributor.imecauthor | Sutar, Surajit | |
| dc.contributor.imecauthor | Banerjee, Sreetama | |
| dc.contributor.imecauthor | Medina, Henry | |
| dc.contributor.imecauthor | Wu, Xiangyu | |
| dc.contributor.imecauthor | Huyghebaert, Cedric | |
| dc.contributor.imecauthor | Brems, Steven | |
| dc.contributor.imecauthor | Lin, Dennis | |
| dc.contributor.imecauthor | Morin, Pierre | |
| dc.contributor.imecauthor | Caymax, Matty | |
| dc.contributor.imecauthor | Asselberghs, Inge | |
| dc.contributor.imecauthor | Radu, Iuliana | |
| dc.contributor.orcidimec | Shi, Yuanyuan::0000-0002-4836-6752 | |
| dc.contributor.orcidimec | Groven, Benjamin::0000-0002-5781-7594 | |
| dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
| dc.contributor.orcidimec | Sutar, Surajit::0000-0003-3114-718X | |
| dc.contributor.orcidimec | Banerjee, Sreetama::0000-0002-6297-9547 | |
| dc.contributor.orcidimec | Huyghebaert, Cedric::0000-0001-6043-7130 | |
| dc.contributor.orcidimec | Brems, Steven::0000-0002-0282-8528 | |
| dc.contributor.orcidimec | Morin, Pierre::0000-0002-4637-496X | |
| dc.contributor.orcidimec | Radu, Iuliana::0000-0002-7230-7218 | |
| dc.date.accessioned | 2022-09-20T09:35:39Z | |
| dc.date.available | 2022-07-09T02:27:23Z | |
| dc.date.available | 2022-09-20T09:35:39Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/IEDM19574.2021.9720676 | |
| dc.identifier.eisbn | 978-1-6654-2572-8 | |
| dc.identifier.issn | 2380-9248 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40078 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Electron Devices Meeting (IEDM) | |
| dc.source.conferencedate | DEC 11-16, 2021 | |
| dc.source.conferencelocation | San Francisco | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Superior electrostatic control in uniform monolayer MoS2 scaled transistors via in-situ surface smoothening | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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