Publication:

Extreme ultraviolet detection using AlGaN-on-Si inverted Schottky photodiodes

Date

2011
Journal article
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dc.contributor.authorMalinowski, Pawel
dc.contributor.authorDuboz, Jean-Yves
dc.contributor.authorDe Moor, Piet
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorJohn, Joachim
dc.contributor.authorMartin Horcajo, Sara
dc.contributor.authorSemond, Fabrice
dc.contributor.authorFrayssinet, Eric
dc.contributor.authorVerhoeve, Peter
dc.contributor.authorEsposito, Marco
dc.contributor.authorGiordanengo, Boris
dc.contributor.authorBenMoussa, Ali
dc.contributor.authorMertens, Robert
dc.contributor.authorVan Hoof, Chris
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.date.accessioned2021-10-19T15:56:04Z
dc.date.available2021-10-19T15:56:04Z
dc.date.issued2011
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19366
dc.identifier.urlhttp://apl.aip.org/resource/1/applab/v98/i14/p141104_s1
dc.source.beginpage141104
dc.source.issue14
dc.source.journalApplied Physics Letters
dc.source.volume98
dc.title

Extreme ultraviolet detection using AlGaN-on-Si inverted Schottky photodiodes

dc.typeJournal article
dspace.entity.typePublication
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