Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Defect assessment and leakage control in Ge pFET junctions
Publication:
Defect assessment and leakage control in Ge pFET junctions
Date
2013-09
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
27366.pdf
31.58 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Simoen, Eddy
;
Eneman, Geert
;
De Jaeger, Brice
;
Wang, Gang
;
Loo, Roger
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1951
since deposited on 2021-10-21
439
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1951
since deposited on 2021-10-21
439
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations