Channel hot carrier degradation mechanism in long/short channel n-FinFETs

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Author(s)

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Roussel, Philippe

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Degraeve, Robin

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Aoulaiche, Marc

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Chiarella, Thomas

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Kauerauf, Thomas

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Horiguchi, Naoto

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

1931 since deposited on 2021-10-21

Acq. date: 2025-10-23