Publication:
Experimental Validation of Process-Induced Variability Aware SPICE Simulation Platform for Sub-20 nm FinFET Technologies
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1169 since deposited on 2023-06-20
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Acq. date: 2025-10-25
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Views
1169 since deposited on 2023-06-20
446item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations