Publication:

Defect-related excess low-frequency noise in Ge-on-Si pMOSFETs

Date

2011

Journal article

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Files

22191.pdf 111.53 KB

Author(s)

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De Jaeger, Brice

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Hoffmann, Thomas Y.

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Journal

IEEE Electron Device Letters

Metrics

1933 since deposited on 2021-10-19

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Acq. date: 2025-12-11