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Characterization and FE analysis on the shear test of electronic materials
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Characterization and FE analysis on the shear test of electronic materials
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Date
2004-12
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gonzalez, Mario
;
Vandevelde, Bart
;
Van Hoof, Rita
;
Beyne, Eric
Journal
Microelectronics Reliability
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1878
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Acq. date: 2026-01-10
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Metrics
Views
1878
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-10
Citations