Publication:

Characterization and FE analysis on the shear test of electronic materials

Date

2004-12
Journal article
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dc.contributor.authorGonzalez, Mario
dc.contributor.authorVandevelde, Bart
dc.contributor.authorVan Hoof, Rita
dc.contributor.authorBeyne, Eric
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorVan Hoof, Rita
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2021-10-15T13:37:06Z
dc.date.available2021-10-15T13:37:06Z
dc.date.issued2004-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8970
dc.source.beginpage1915
dc.source.endpage1921
dc.source.issue12
dc.source.journalMicroelectronics Reliability
dc.source.volume44
dc.title

Characterization and FE analysis on the shear test of electronic materials

dc.typeJournal article
dspace.entity.typePublication
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