Publication:
Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p- channel MuGFETs
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1893 since deposited on 2021-10-18
Acq. date: 2025-10-23
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Views
1893 since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations