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Unbiased roughness measurements from low signal-to-noise ratio scanning electron microscope images
Publication:
Unbiased roughness measurements from low signal-to-noise ratio scanning electron microscope images
Date
2023
Journal article
https://doi.org/10.1117/1.JMM.22.2.021006
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mack, Chris A.
;
Severi, Joren
;
Zidan, Mohamed
;
De Simone, Danilo
;
Lorusso, Gian
Journal
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
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883
since deposited on 2024-01-08
Acq. date: 2025-10-28
Citations
Metrics
Views
883
since deposited on 2024-01-08
Acq. date: 2025-10-28
Citations