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Reliability of ultra-thin gate oxide below 3 nm in the direct tunneling regime
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2 since deposited on 2021-09-30
Acq. date: 2025-12-15
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1911 since deposited on 2021-09-30
Acq. date: 2025-12-15
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2 since deposited on 2021-09-30
Acq. date: 2025-12-15
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1911 since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations