Publication:
Reliability of ultra-thin gate oxide below 3 nm in the direct tunneling regime
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
2 since deposited on 2021-09-30
Acq. date: 2026-10-12
Views
1919 since deposited on 2021-09-30
1last month
Acq. date: 2026-10-12
Citations
Statistics
Downloads
2 since deposited on 2021-09-30
Acq. date: 2026-10-12
Views
1919 since deposited on 2021-09-30
1last month
Acq. date: 2026-10-12
Citations