Publication:

Nitrogen profiling in high-k layers has much to gain from a combined TOFSIMS-Angle resolved XPS combined study

Date

2005
Proceedings Paper
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dc.contributor.authorConard, Thierry
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorBrijs, Bert
dc.contributor.authorMack, P.
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.accessioned2021-10-16T01:01:47Z
dc.date.available2021-10-16T01:01:47Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10255
dc.source.conferenceSIMS XV - 15th International Conference on Secondary Ion Mass Spectrometry
dc.source.conferencedate12/09/2005
dc.source.conferencelocationManchester UK
dc.title

Nitrogen profiling in high-k layers has much to gain from a combined TOFSIMS-Angle resolved XPS combined study

dc.typeProceedings paper
dspace.entity.typePublication
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