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On the correlation between drain-gate breakdown voltage and hot-electron reliability in InP HEMT's
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1882 since deposited on 2021-10-14
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Acq. date: 2025-10-25
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Views
1882 since deposited on 2021-10-14
403item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations