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Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals
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Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals
Date
2017
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chai, Zheng
;
Ma, Jigang
;
Zhang, Weidong
;
Govoreanu, Bogdan
;
Ji, Zhigang
;
Zhang, Jian Fu
;
Jurczak, Gosia
Journal
IEEE Transactions on Electron Devices
Abstract
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1947
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Acq. date: 2025-10-24
Citations
Metrics
Views
1947
since deposited on 2021-10-24
417
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations