Publication:

Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals

Date

2017
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorChai, Zheng
dc.contributor.authorMa, Jigang
dc.contributor.authorZhang, Weidong
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorJi, Zhigang
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorJurczak, Gosia
dc.date.accessioned2021-10-24T03:22:29Z
dc.date.available2021-10-24T03:22:29Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27998
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8019848/
dc.source.beginpage4099
dc.source.endpage4105
dc.source.issue10
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume64
dc.title

Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
35684.pdf
Size:
6.84 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles