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Precise measurement of thin film thickness in 3D-NAND device with CD-SEM
Publication:
Precise measurement of thin film thickness in 3D-NAND device with CD-SEM
Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohashi, Takeyoshi
;
Atsuko, Yamaguchi
;
Kobayashi, Takashi
;
Inoue, Osamu
;
Hasumi, Kazuhisa
;
Ikota, Masami
;
Tan, Chi Lim
;
Van den Bosch, Geert
;
Lorusso, Gian
;
Furnemont, Arnaud
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1977
since deposited on 2021-10-23
Acq. date: 2025-10-22
Citations
Metrics
Views
1977
since deposited on 2021-10-23
Acq. date: 2025-10-22
Citations