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On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers
Publication:
On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Shamuilia, Sheron
;
Simons, Veerle
;
Gaubas, E.
;
Delhougne, Romain
;
Loo, Roger
;
De Meyer, Kristin
;
Claeys, Cor
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1923
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1923
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations