Publication:

On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers

Date

2005
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorShamuilia, Sheron
dc.contributor.authorSimons, Veerle
dc.contributor.authorGaubas, E.
dc.contributor.authorDelhougne, Romain
dc.contributor.authorLoo, Roger
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-16T05:04:52Z
dc.date.available2021-10-16T05:04:52Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11208
dc.source.beginpage285
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting
dc.source.conferencedate25/09/2005
dc.source.conferencelocationGiens France
dc.source.endpage290
dc.title

On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers

dc.typeProceedings paper
dspace.entity.typePublication
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