Publication:
Theoretical and experimental study of the front and back interface trap density in accumulation mode SOI MOSFETs at low temperatures
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1931 since deposited on 2021-09-29
1last month
Acq. date: 2026-02-24
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Views
1931 since deposited on 2021-09-29
1last month
Acq. date: 2026-02-24
Citations