Publication:

Characterization of oxide defects in InGaAs MOS gate stacks for high-mobility n-channel MOSFETs

Date

2017

Proceedings Paper

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Files

36824.pdf 1.83 MB

Author(s)

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Roussel, Philippe

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Groeseneken, Guido

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Collaert, Nadine

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Linten, Dimitri

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Statistics

1945 since deposited on 2021-10-24

Acq. date: 2026-03-17