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Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers
Publication:
Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers
Date
2021
Journal article
https://doi.org/10.1016/j.sse.2021.108066
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Izmailov, R. A.
;
O'Sullivan, Barry
;
Popovici, Mihaela Ioana
;
Afanas'ev, V. V.
Journal
SOLID-STATE ELECTRONICS
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1842
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1842
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations