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A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides
Publication:
A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides
Date
1996
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
Journal
Microelectronics and Reliability
Abstract
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1996
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1996
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations