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Publication:

Determination of tunnelling parameters in ultra-thin oxide poly-Si/SiO2/Si structures

Date

1995

Journal article

Simple item page Full metadata Statistics

Files

597.pdf 633.02 KB

Author(s)

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Van Meirhaeghe, R. L.

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Journal

Solid-State Electronics

Statistics

2024 since deposited on 2021-09-29

Acq. date: 2026-07-28