Publication:
Role of hydrogen on negative bias temperature instability in HfO2-based hole channel field-effect transistors
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1874 since deposited on 2021-10-15
6last month
1last week
Acq. date: 2025-12-08
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Views
1874 since deposited on 2021-10-15
6last month
1last week
Acq. date: 2025-12-08
Citations