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Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe
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Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe
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Date
2024
Journal article
https://doi.org/10.1088/1361-6501/ad366b
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beltran-Pitarch, Braulio
;
Guralnik, Benny
;
Borup, Kasper A.
;
Adelmann, Christoph
;
Hansen, Ole
;
Pryds, Nini
;
Petersen, Dirch H.
Journal
MEASUREMENT SCIENCE AND TECHNOLOGY
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218
since deposited on 2024-04-09
Acq. date: 2025-12-09
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Metrics
Downloads
161
since deposited on 2024-04-09
62
last month
16
last week
Acq. date: 2025-12-09
Views
218
since deposited on 2024-04-09
Acq. date: 2025-12-09
Citations