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Impact of LER on BEOL dielectric reliability: a quantitative model and experimental validation
Publication:
Impact of LER on BEOL dielectric reliability: a quantitative model and experimental validation
Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tokei, Zsolt
;
Roussel, Philippe
;
Stucchi, Michele
;
Versluijs, Janko
;
Ciofi, Ivan
;
Carbonell, Laure
;
Beyer, Gerald
;
Cockburn, Andrew
;
Augustin, M.
;
Shah, Kavita
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1916
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1916
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations