Publication:

Advanced 300-mm waferscale patterning for silicon photonics devices with record low loss and phase errors

Date

2012
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

25195.pdf 241.36 KB

Author(s)

Selvaraja, Shankar
;
Murdoch, Gayle  
;
Milenin, Alexey  
;
Delvaux, Christie  
;
Ong, Patrick  
;
Pathak, Shibnath
;
Vermeulen, Diedrik
;
Sterckx, Gunther  
;
Winroth, Gustaf
;
Verheyen, Peter  
;
Lepage, Guy  
;
Bogaerts, Wim  
;
Baets, Roel  
;
Van Campenhout, Joris  
;
Absil, Philippe  

Journal

Abstract

Description

Statistics

Views

2000 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-01-26

Citations

Statistics

Views

2000 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-01-26

Citations