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Characterization of porous structures in advanced low-k films with thin TaN layers using monoenergetic positron beams
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Characterization of porous structures in advanced low-k films with thin TaN layers using monoenergetic positron beams
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Uedono, Akira
;
Verdonck, Patrick
;
Delabie, Annelies
;
Swerts, Johan
;
Witters, Thomas
;
Conard, Thierry
;
Baklanov, Mikhaïl
;
Van Elshocht, Sven
;
Oshima, Nagayasu
;
Suzuki, Ryoichi
Journal
Japanese Journal of Applied Physics
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1894
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Acq. date: 2025-12-12
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Metrics
Views
1894
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-12
Citations