Publication:
Strong correlation between dielectric reliability and charge trapping in SiO2/Al2O3 gate stacks with TiN electrodes
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2015 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-07
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Metrics
Views
2015 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-07
Citations