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Articles
Pulsed I-V on TFETs: modeling and measurements
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Pulsed I-V on TFETs: modeling and measurements
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Smets, Quentin
;
Verhulst, Anne
;
Kim, Ji-hong
;
Jason, Campbell
;
Nminibapiel, David
;
Veksler, Dmitry
;
Shrestha, Pragya
;
Pandey, Rahul
;
Simoen, Eddy
;
Gundlach, David
;
Richter, Curt
;
Cheung, Kin. P.
;
Datta, Suman
;
Mocuta, Anda
;
Collaert, Nadine
;
Thean, Aaron V-Y.
;
Heyns, Marc
Journal
IEEE Transactions on Electron Devices
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1954
since deposited on 2021-10-24
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Acq. date: 2025-12-10
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Metrics
Views
1954
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
Citations