Publication:

Pulsed I-V on TFETs: modeling and measurements

Date

2017
Journal article
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dc.contributor.authorSmets, Quentin
dc.contributor.authorVerhulst, Anne
dc.contributor.authorKim, Ji-hong
dc.contributor.authorJason, Campbell
dc.contributor.authorNminibapiel, David
dc.contributor.authorVeksler, Dmitry
dc.contributor.authorShrestha, Pragya
dc.contributor.authorPandey, Rahul
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGundlach, David
dc.contributor.authorRichter, Curt
dc.contributor.authorCheung, Kin. P.
dc.contributor.authorDatta, Suman
dc.contributor.authorMocuta, Anda
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron V-Y.
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-24T13:49:18Z
dc.date.available2021-10-24T13:49:18Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29463
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7873334/
dc.source.beginpage1489
dc.source.endpage1497
dc.source.issue4
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume64
dc.title

Pulsed I-V on TFETs: modeling and measurements

dc.typeJournal article
dspace.entity.typePublication
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