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High doping density/high electric field, stress and heterojunction effects on the characteristisc of CMOS compatible p-n junctions
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High doping density/high electric field, stress and heterojunction effects on the characteristisc of CMOS compatible p-n junctions
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Bargallo Gonzalez, Mireia
;
Kobayashi, Daisuke
;
Luque Rodriguez, Abraham
;
Jimenez Tejada, J.-A.
;
Claeys, Cor
Journal
Journal of the Electrochemical Society
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1918
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Acq. date: 2025-12-10
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Views
1918
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-10
Citations