Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Sidewall damage and electrical performance of porous dielectrics in narrow spaced interconnects
Publication:
Sidewall damage and electrical performance of porous dielectrics in narrow spaced interconnects
Copy permalink
Date
2004-05
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Iacopi, Francesca
;
Travaly, Youssef
;
Stucchi, Michele
;
Struyf, Herbert
;
Peeters, Stefan
;
Jonckheere, Rik
;
Leunissen, Peter
;
Tokei, Zsolt
;
Sutcliffe, Victor
;
Richard, Olivier
;
Van Hove, Marleen
;
Maex, Karen
Journal
Abstract
Description
Metrics
Views
1874
since deposited on 2021-10-15
Acq. date: 2026-01-07
Citations
Metrics
Views
1874
since deposited on 2021-10-15
Acq. date: 2026-01-07
Citations